Characterization of Materials

A multidisciplinary course offering a practical introduction to techniques of imaging structure and compositional analysis of advanced materials. Focus on principles and applications of various characterization methods. Covered topics include AFM, SEM, TEM, XRD, EDX/WDX, EELS, Raman, Ellipsometry, Confocal Microscopy, sample preparation and image processing, etc. Hands-on experience is emphasized.